Thorough testing of any multiport memory with linear tests
نویسندگان
چکیده
منابع مشابه
Thorough testing of any multiport memory with linear tests
The quality of tests, in terms of fault coverage and test length, is strongly dependent on the used fault models. This paper presents realistic fault models for multiport memories with p ports, based on defect injection and SPICE simulation. The results show that the fault models for -port memories consist of p classes: single-port faults, two-port faults,..., -port faults. In addition, the pap...
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ژورنال
عنوان ژورنال: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
سال: 2002
ISSN: 0278-0070
DOI: 10.1109/43.980260